SPIE Proceedings [SPIE International Symposium on Instrumentation Science and Technology - Shenyang, China (Monday 15 September 2008)] Fifth International Symposium on Instrumentation Science and Technology - Multi-channel high-speed CMOS image acquisition and pre-processing system
Sun, Chun-feng, Yuan, Feng, Ding, Zhen-liang, Tan, Jiubin, Wen, XianfangVolume:
7133
Year:
2009
Language:
english
DOI:
10.1117/12.810514
File:
PDF, 214 KB
english, 2009