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Time-of-flight scattering and recoiling spectrometer (TOF-SARS) for surface analysis
Grizzi, O., Shi, M., Bu, H., Rabalais, J. W.Volume:
61
Year:
1990
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1141488
File:
PDF, 1.68 MB
english, 1990