Characterization of defect-related optical absorption in ZnGeP[sub 2]
Setzler, S. D., Schunemann, P. G., Pollak, T. M., Ohmer, M. C., Goldstein, J. T., Hopkins, F. K., Stevens, K. T., Halliburton, L. E., Giles, N. C.Volume:
86
Year:
1999
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.371743
File:
PDF, 211 KB
english, 1999