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Refractive indices of layered semiconductor ferroelectrics TlInS[sub 2], TlGaS[sub 2], and TlGaSe[sub 2] from ellipsometric measurements limited to only layer-plane surfaces
Shim, YongGu, Okada, Wataru, Wakita, Kazuki, Mamedov, NazimVolume:
102
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2800827
File:
PDF, 368 KB
english, 2007