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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Manufacturing and Testing VIII - Accuracy of freeform manufacturing processes

Gubbels, G. P. H., Burge, James H., Fähnle, Oliver W., Venrooy, B. W. H., Henselmans, R., Williamson, Ray
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Volume:
7426
Year:
2009
Language:
english
DOI:
10.1117/12.825829
File:
PDF, 6.77 MB
english, 2009
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