Influence of surface topography on depth profiles obtained...

Journal of Applied Physics 2000 Vol. 87; Iss. 1

Influence of surface topography on depth profiles obtained by Rutherford backscattering spectrometry

Slotte, J., Laakso, A., Ahlgren, T., Rauhala, E., Salonen, R., Räisänen, J., Simon, A., Uzonyi, I., Kiss, Á. Z., Somorjai, E.
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Volume:
87
Year:
2000
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.371835
File:
PDF, 517 KB
english, 2000
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