Digitally tunable, wide-band amplitude, phase, and frequency detection for atomic-resolution scanning force microscopy
Khan, Z., Leung, C., Tahir, B. A., Hoogenboom, B. W.Volume:
81
Year:
2010
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3458009
File:
PDF, 532 KB
english, 2010