[IEEE 1997 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (13-16 Oct. 1997)] 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) - Acceleration factors of PMOS hot carrier degradation
Katto, H.Language:
english
DOI:
10.1109/IRWS.1997.660274
Date:
October, 1997
File:
PDF, 444 KB
english, 1997