![](/img/cover-not-exists.png)
[IEEE 2006 International Conference on Simulation of Semiconductor Processes and Devices - Monterey, CA, USA (2006.09.6-2006.09.8)] 2006 International Conference on Simulation of Semiconductor Processes and Devices - Simulation of NOR-Flash Memory Cells Focusing on Narrow Channel Effects on VTH Dispersion
Kondo, Masaki, Nakauchi, Takahiro, Ito, Sanae, Aoki, Nobutoshi, Nakamura, Mitsutoshi, Naruke, Kiyomi, Ishiuchi, HidemiYear:
2006
Language:
english
DOI:
10.1109/SISPAD.2006.282854
File:
PDF, 3.76 MB
english, 2006