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A quantitative method for determination of carrier escape efficiency in GaN-based light-emitting diodes: A comparison of open- and short-circuit photoluminescence
Lim, Seung-Hyuk, Ko, Young-Ho, Cho, Yong-HoonVolume:
104
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4867238
Date:
March, 2014
File:
PDF, 854 KB
english, 2014