[IEEE 2008 19th International Conference on Pattern...

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[IEEE 2008 19th International Conference on Pattern Recognition (ICPR) - Tampa, FL, USA (2008.12.8-2008.12.11)] 2008 19th International Conference on Pattern Recognition - A practical method to reducing metal artifact for dental CT scanners

Kobayashi, Koji, Atsushi Katsumata,, Koichi Ito,, Takafumi Aoki,
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Year:
2008
Language:
english
DOI:
10.1109/ICPR.2008.4761740
File:
PDF, 585 KB
english, 2008
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