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[IEEE 2013 National Security Days (JNS3) - Rabat, Morocco (2013.04.26-2013.04.27)] 2013 National Security Days (JNS3) - Abstract tests based on SysML models for EMV Card
Ouerdi, Noura, Ziane, M'hammed, Azizi, Abdelmalek, Azizi, Mostafa, Lanet, Jean-LouisYear:
2013
Language:
english
DOI:
10.1109/JNS3.2013.6595461
File:
PDF, 5.38 MB
english, 2013