An intelligent data mining system for drop test analysis of...

IEEE Transactions on Electronics Packaging Manufacturing 2001 / 07 Vol. 24; Iss. 3

An intelligent data mining system for drop test analysis of electronic products

Chi Zhou,, Nelson, P.C., Weimin Xiao,, Tirpak, T.M., Lane, S.A.
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Volume:
24
Language:
english
Journal:
IEEE Transactions on Electronics Packaging Manufacturing
DOI:
10.1109/6104.956808
Date:
July, 2001
File:
PDF, 155 KB
english, 2001
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