Counterfeit Integrated Circuits: Detection, Avoidance, and...

Journal of Electronic Testing 2014 / 02 Vol. 30; Iss. 1

Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead

Guin, Ujjwal, DiMase, Daniel, Tehranipoor, Mohammad
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Volume:
30
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-013-5430-8
Date:
February, 2014
File:
PDF, 671 KB
english, 2014
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