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Coupling induced soft error mechanisms in nanoscale CMOS technologies
Sayil, Selahattin, Wang, JuyuVolume:
79
Language:
english
Journal:
Analog Integrated Circuits and Signal Processing
DOI:
10.1007/s10470-013-0216-6
Date:
April, 2014
File:
PDF, 1.68 MB
english, 2014