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Measurement of MKID Performance with High-Speed and Wide-Band Readout System
Karatsu, Kenichi, Naruse, M., Nitta, T., Sekine, M., Sekiguchi, S., Sekimoto, Y., Noguchi, T., Uzawa, Y., Matsuo, H., Kiuchi, H.Volume:
176
Language:
english
Journal:
Journal of Low Temperature Physics
DOI:
10.1007/s10909-014-1115-7
Date:
August, 2014
File:
PDF, 519 KB
english, 2014