Failure analysis of EOS-induced damage at final electrical...

Journal of Materials Science: Materials in Electronics 2014 / 02 Vol. 25; Iss. 2

Failure analysis of EOS-induced damage at final electrical testing

Chen, Ming-Kun, Huang, Yu-Jung, Cheng, Chi-Chan, Lin, Yi-Lung, Fu, Shen-Li
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Volume:
25
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-013-1521-7
Date:
February, 2014
File:
PDF, 655 KB
english, 2014
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