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Novel tip modification method for measurement of the adhesive force between a silanized surface and a locally modified tip using atomic force microscopy
Han, Seung Pil, Suga, Kosaku, Fujihira, Masamichi, Park, Byung-EunVolume:
64
Language:
english
Journal:
Journal of the Korean Physical Society
DOI:
10.3938/jkps.64.63
Date:
January, 2014
File:
PDF, 289 KB
english, 2014