Intelligent maintenance prediction system for LED wafer...

Journal of Intelligent Manufacturing 2016 / 4 Vol. 27; Iss. 2

Intelligent maintenance prediction system for LED wafer testing machine

Hsu, Chien-Chang, Chen, Min-Sheng
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Volume:
27
Language:
english
Journal:
Journal of Intelligent Manufacturing
DOI:
10.1007/s10845-013-0866-3
Date:
April, 2016
File:
PDF, 382 KB
english, 2016
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