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Digital rectal examination in a simulated environment using sweeping palpation and mechanical localization
Kim, Yeongjin, Ahn, Bummo, Na, Youngjin, Shin, Taeyoung, Rha, Koonho, Kim, JungVolume:
15
Language:
english
Journal:
International Journal of Precision Engineering and Manufacturing
DOI:
10.1007/s12541-013-0321-6
Date:
January, 2014
File:
PDF, 1.30 MB
english, 2014