A statistical approach to fit Gaussian part of full-energy...

Science China Technological Sciences 2014 / 01 Vol. 57; Iss. 1

A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers

Li, Zhe, Tuo, XianGuo, Shi, Rui, Yang, JianBo
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Volume:
57
Language:
english
Journal:
Science China Technological Sciences
DOI:
10.1007/s11431-013-5427-7
Date:
January, 2014
File:
PDF, 718 KB
english, 2014
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