Leakage current in a Si-based nanopore structure and its...

Leakage current in a Si-based nanopore structure and its influence on noise characteristics

Lee, Min-Hyun, Lee, Ju-Hyun, Kim, Hyun-Mi, Kim, Young-Rok, Jeon, Tae-Joon, Eugene Pak, Y., Kim, Ki-Bum
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Volume:
16
Language:
english
Journal:
Microfluidics and Nanofluidics
DOI:
10.1007/s10404-013-1192-y
Date:
January, 2014
File:
PDF, 648 KB
english, 2014
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