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UVM-based verification methodology for RFID-enabled smart-sensor systems
Sathyamurthy, Muralikrishna, Neumann, Felix, Kotynia, Lukasz, Hennig, EckhardVolume:
78
Language:
english
Journal:
Analog Integrated Circuits and Signal Processing
DOI:
10.1007/s10470-013-0225-5
Date:
January, 2014
File:
PDF, 1.35 MB
english, 2014