The features of X-ray topographic contrast formation in...

Crystallography Reports 2013 / 12 Vol. 58; Iss. 7

The features of X-ray topographic contrast formation in silicon with dislocation clusters

Fodchuk, I. M., Novikov, S. N., Fedortsov, D. G., Struk, A. Ya., Yaremchuk, I. V.
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Volume:
58
Language:
english
Journal:
Crystallography Reports
DOI:
10.1134/S1063774513070080
Date:
December, 2013
File:
PDF, 1.51 MB
english, 2013
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