Multi-bit Sigma-Delta TDC Architecture with Improved Linearity
Uemori, Satoshi, Ishii, Masamichi, Kobayashi, Haruo, Hirabayashi, Daiki, Arakawa, Yuta, Doi, Yuta, Kobayashi, Osamu, Matsuura, Tatsuji, Niitsu, Kiichi, Yano, Yuji, Gake, Tatsuhiro, Yamaguchi, TakahiroVolume:
29
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-013-5408-6
Date:
December, 2013
File:
PDF, 1.68 MB
english, 2013