Study of Low-Cost Electrical Test Strategies for...

Journal of Electronic Testing 2014 / 02 Vol. 30; Iss. 1

Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers

Rekik, Ahmed Amine, Azaïs, Florence, Mailly, Frédérick, Nouet, Pascal
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
30
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-013-5423-7
Date:
February, 2014
File:
PDF, 1015 KB
english, 2014
Conversion to is in progress
Conversion to is failed