Analysis of the optical and structural properties of oxide...

Analysis of the optical and structural properties of oxide films on InP using spectroscopic ellipsometry

Shvets, V. A., Rykhlitskii, S. V., Mittova, I. Ya., Tomina, E. V.
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Volume:
58
Language:
english
Journal:
Technical Physics
DOI:
10.1134/S1063784213110248
Date:
November, 2013
File:
PDF, 256 KB
english, 2013
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