Measurement of local thickness of oxide layer and its...

Nanotechnologies in Russia 2013 / 09 Vol. 8; Iss. 9-10

Measurement of local thickness of oxide layer and its electronic characteristics by scanning tunneling microscopy

Gatin, A. K., Grishin, M. V., Kirsankin, A. A., Kozhushner, M. A., Posvyanskii, V. S., Kharitonov, V. A., Shub, B. R.
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Volume:
8
Language:
english
Journal:
Nanotechnologies in Russia
DOI:
10.1134/S1995078013050030
Date:
September, 2013
File:
PDF, 179 KB
english, 2013
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