Study of the interaction mechanisms between absorbed NO2andpor-Si/SnOxnanocomposite layers
Bolotov, V. V., Kan, V. E., Makushenko, R. K., Biryukov, M. Yu., Ivlev, K. E., Roslikov, V. E.Volume:
47
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782613100059
Date:
October, 2013
File:
PDF, 237 KB
english, 2013