The off-state gate isolation technique to improve ASET...

Science China Technological Sciences 2013 / 10 Vol. 56; Iss. 10

The off-state gate isolation technique to improve ASET tolerance in differential analog design

Hu, ChunMei, Chen, ShuMing, Chen, JianJun, Qin, JunRui
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Volume:
56
Language:
english
Journal:
Science China Technological Sciences
DOI:
10.1007/s11431-013-5343-x
Date:
October, 2013
File:
PDF, 676 KB
english, 2013
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