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Large scale scanning probe microscope: Making the shear-force scanning visible
Bosma, E., Offerhaus, H. L., van der Veen, J. T., Segerink, F. B., van Wessel, I. M.Volume:
78
Year:
2010
Language:
english
Journal:
American Journal of Physics
DOI:
10.1119/1.3319657
File:
PDF, 876 KB
english, 2010