Estimating Remaining Useful Life With Three-Source Variability in Degradation Modeling
Si, Xiao-Sheng, Wang, Wenbin, Hu, Chang-Hua, Zhou, Dong-HuaVolume:
63
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2014.2299151
Date:
March, 2014
File:
PDF, 5.71 MB
english, 2014