[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - A Ta2O5 solid-electrolyte switch with improved reliability
Sakamoto, Toshitsugu, Banno, Naoki, Iguchi, Noriyuki, Kawaura, Hisao, Sunamura, Hiroshi, Fujieda, Shinji, Terabe, Kazuya, Hasegawa, Tsuyoshi, Aono, MasakazuYear:
2007
Language:
english
DOI:
10.1109/VLSIT.2007.4339718
File:
PDF, 1.26 MB
english, 2007