Automated Design Error Localization in RTL Designs

IEEE Design and Test 2014 / 2 Vol. 31; Iss. 1

Automated Design Error Localization in RTL Designs

Jenihhin, Maksim, Tsepurov, Anton, Tihhomirov, Valentin, Raik, Jaan, Hantson, Hanno, Ubar, Raimund, Bartsch, Gunter, Escobar, JorgeHernan Meza, Wuttke, Heinz-Dietrich
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Volume:
31
Language:
english
Journal:
IEEE Design & Test
DOI:
10.1109/MDAT.2013.2271420
Date:
February, 2014
File:
PDF, 1.05 MB
english, 2014
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