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[IEEE 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Bologna, Italy (2013.06.30-2013.07.4)] 2013 IEEE International Conference on Solid Dielectrics (ICSD) - Damage processes of polyimide film caused by surface discharge
Luo, Yang, Wu, Guangning, Liu, Jiwu, Zhu, Guangya, Wang, Peng, Cao, KaijiangYear:
2013
Language:
english
DOI:
10.1109/ICSD.2013.6619703
File:
PDF, 1.07 MB
english, 2013