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[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - Lifetime prediction of IGBT modules for traction applications
Ciappa, M., Fichtner, W.Year:
2000
Language:
english
DOI:
10.1109/RELPHY.2000.843917
File:
PDF, 659 KB
english, 2000