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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Post-Silicon Timing Validation Method Using Path Delay Measurements
Jang, Eun Jung, Chung, Jaeyong, Gattiker, Anne, Nassif, Sani, Abraham, Jacob A.Year:
2011
Language:
english
DOI:
10.1109/ATS.2011.32
File:
PDF, 684 KB
english, 2011