Irradiation Damage Tests on Backside-Illuminated CMOS APS Prototypes for the Extreme Ultraviolet Imager On-Board Solar Orbiter
BenMoussa, A., Gissot, S., Giordanengo, B., Meynants, G., Wang, X., Wolfs, B., Bogaerts, J., Schuhle, U., Berger, G., Gottwald, A., Laubis, C., Kroth, U., Scholze, F., Soltani, A., Saito, T.Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2279550
Date:
October, 2013
File:
PDF, 1.28 MB
english, 2013