Bias Effects on Total Dose-Induced Degradation of Bipolar...

IEEE Transactions on Nuclear Science 2010 / 08 Vol. 57; Iss. 4

Bias Effects on Total Dose-Induced Degradation of Bipolar Linear Microcircuits for Switched Dose-Rate Irradiation

Velo, Y. Gonzalez, Boch, Jérôme, Roche, Nicolas Jean-Henri, Perez, Stephanie, Vaille, Jean-Roch, Dusseau, Laurent, Saigne, Frédéric, Lorfevre, Eric, Schrimpf, Ronald. D., Chatry, Christian, Canals, An
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Volume:
57
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2010.2043370
Date:
August, 2010
File:
PDF, 1.32 MB
english, 2010
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