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[IEEE 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) - Tampa, FL, USA (2013.06.16-2013.06.21)] 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) - Phase identification of RF-sputtered SnS thin films using rietveld analysis of X-ray diffraction patterns
Banai, Rona E., Lee, Hyeonseok, Zlotnikov, Sivan, Brownson, Jeffrey R. S., Horn, Mark W.Year:
2013
Language:
english
DOI:
10.1109/PVSC.2013.6744997
File:
PDF, 1.70 MB
english, 2013