Measurement Techniques for RF Nanoelectronic Devices: New...

IEEE Microwave Magazine 2014 / 01 Vol. 15; Iss. 1

Measurement Techniques for RF Nanoelectronic Devices: New Equipment to Overcome the Problems of Impedance and Scale Mismatch

Happy, Henri, Haddadi, Kamel, Theron, Didier, Lasri, Tuami, Dambrine, Giles
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Volume:
15
Language:
english
Journal:
IEEE Microwave Magazine
DOI:
10.1109/MMM.2013.2288710
Date:
January, 2014
File:
PDF, 2.42 MB
english, 2014
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