[IEEE 2008 IEEE International Symposium on Circuits and...

  • Main
  • [IEEE 2008 IEEE International Symposium...

[IEEE 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008 - Seattle, WA, USA (2008.05.18-2008.05.21)] 2008 IEEE International Symposium on Circuits and Systems - Statistical image modeling using von Mises distribution in the complex directional wavelet domain

Vo, An P.N., Oraintara, Soontorn, Nguyen, Truong T.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/ISCAS.2008.4542060
File:
PDF, 306 KB
english, 2008
Conversion to is in progress
Conversion to is failed