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[IEEE 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008 - Seattle, WA, USA (2008.05.18-2008.05.21)] 2008 IEEE International Symposium on Circuits and Systems - Statistical image modeling using von Mises distribution in the complex directional wavelet domain
Vo, An P.N., Oraintara, Soontorn, Nguyen, Truong T.Year:
2008
Language:
english
DOI:
10.1109/ISCAS.2008.4542060
File:
PDF, 306 KB
english, 2008