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[IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - Electrical resistivity characterization of silicon carbide by various methods
Bouanga, C. Vanga, Savoie, S., Frechette, M. F., Couderc, H., David, E.Year:
2012
Language:
english
DOI:
10.1109/ELINSL.2012.6251423
File:
PDF, 902 KB
english, 2012