Intrinsic Tolerance to Total Ionizing Dose Radiation in Gate-All-Around MOSFETs
Comfort, Everett S., Rodgers, Martin P., Allen, William, Gausepohl, Steve C., Zhang, Enxia X., Alles, Michael L., Hughes, Harold L., McMarr, Patrick J., Lee, Ji UngVolume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2280247
Date:
December, 2013
File:
PDF, 642 KB
english, 2013