Electron Transport Models and Precision Measurements With the Constant Voltage Conductivity Method
Dekany, Justin, Dennison, John Robert, Sim, Alec M., Brunson, JerilynVolume:
41
Language:
english
Journal:
IEEE Transactions on Plasma Science
DOI:
10.1109/TPS.2013.2288366
Date:
December, 2013
File:
PDF, 955 KB
english, 2013