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Stability and migration of charged oxygen interstitials in ThO2 and CeO2
Xiao, H.Y., Zhang, Y., Weber, W.J.Volume:
61
Language:
english
Journal:
Acta Materialia
DOI:
10.1016/j.actamat.2013.09.001
Date:
December, 2013
File:
PDF, 1.62 MB
english, 2013