Neutrons-Induced IGBT Failure: Effects of the Number of...

IEEE Transactions on Nuclear Science 2013 / 8 Vol. 60; Iss. 4

Neutrons-Induced IGBT Failure: Effects of the Number of Tested Devices on the Cross Section Calculation

Touboul, Antoine D., Foro, Lionel L., Wrobel, Frederic, Guetarni, Karima, Boch, Jerome, Saigne, Frederic
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2248747
Date:
August, 2013
File:
PDF, 836 KB
english, 2013
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