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-shell ionization cross sections of Si by 3–25-keV electron impact using the thick-target method
Zhu, Jingjun, An, Zhu, Liu, Mantian, Tian, LixiaVolume:
79
Language:
english
Journal:
Physical Review A
DOI:
10.1103/PhysRevA.79.052710
Date:
May, 2009
File:
PDF, 407 KB
english, 2009