[IEEE 2001 IEEE Nuclear Science Symposium Conference Record - San Diego, CA, USA (4-10 Nov. 2001)] 2001 IEEE Nuclear Science Symposium Conference Record (Cat. No.01CH37310) - X-ray laminographic application of lens-coupled CMOS detector for PCB inspection
Ho Kyung Kim,, Sung Chae Jeon,, Gyuseong Cho,, Seong-Hoon Lim,Volume:
3
Year:
2002
Language:
english
DOI:
10.1109/NSSMIC.2001.1008651
File:
PDF, 385 KB
english, 2002