Free-exciton confinement by layer stacking faults in GaSe:...

Free-exciton confinement by layer stacking faults in GaSe: Evidence from time-resolved spectroscopy

Zhang, X. -C., Gal, M., Nurmikko, A. V.
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Volume:
30
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.30.6214
Date:
November, 1984
File:
PDF, 184 KB
english, 1984
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